WHITE LIGHT INTERFERENCE THICKNESS SCANNER

Ideal for real-time thickness measurement of transparent and semi-transparent materials in demanding applications. Film & Sheet Lines: Accurately measures single-layer films such as PC, PMMA, Optical Films, CPP, CPE, PI, and PET on Blown Film, Cast, and Biax lines. Coating & Converting: Simultaneously measures each individual layer in transparent or semi- transparent multi-layer structures with high precision. Our gauge achieves ultra-high precision by leveraging the principle of optical interferometry,supported by our self -developed, patented core components for exceptional stability andreliability. Scanning is driven by a high-precision servo motor for superior positioning accuracy,while high-speed Ethernet communication enables perfectly synchronized measurement inmulti-gauge systems.